Fig. 2: Abutting head-to-head (H2H) domains at the interface of two thermocompressively bonded LNO crystals.

A Schematic of H2H sample processing for scanning probe microscopy imaging. Sample is cut and polished to allow for AFM analysis of the interface. B–D AFM topography, PFM phase, PFM amplitude and c-AFM of bonded region (inset). c-AFM (inset in D) was obtained with bias of −9.5 V applied to the base of the sample. E Schematic of second-harmonic microscopy for imaging the interface. F 3D Cherenkov second-harmonic generation (CSHG) image of a region of the H2H bonded interface. G Plot of integrated current against distance from the interface taken from the c-AFM data (inset in D).