Fig. 2: Morphology analysis for the E- and P-interface.

a, b The full width (FWHM) at half maximum (histograms), Herman’s orientation parameters (H), and intermix factor (Λ) of π-π stacking peak at OOP direction of PA system and SMA system. c The lamellar features in blend films are a combination of the individual lamellar features for donor and acceptors, normalized to neat donor films. The higher rDoC for actual lamellar feature compared to expected rDoC indicates that the mixed phase contains the packed lamellar order in excess of expected. d The edge-on diffraction intensity (of diffraction ring) ratio to lamellar stacking peak for two systems.