Fig. 8: Effect of high deformation and lower stacking fault energy promoting intense plastic localization.

a Distributions of the plastic localization amplitude as a function of the applied plastic strain for CrCoNi deformed at 77K and 20K. The average localization amplitude, the average of the 5% most intense deformation events and the maximum localization have been shown using orange circles, black squares and blue triangles, respectively. Source data are provided as a Source Data file. Reduced regions of HR-DIC ϵ_xx strain maps with the grain of interest marked for CrCoNi deformed at 77K corresponding to macroscopic plastic strains of (b) 0.73% and (c) 4.64%. d EBSD inverse pole figure map along the normal (z) direction indexed using the dictionary indexation approach. The misorientation profile across a deformation twin along the black line is shown in the inset. X indicates the loading direction. e Latent space feature map resulting from the encoding of electron backscatter diffraction pattern and revealing thin deformation twins. f Reduced region of the HR-DIC ϵ_xx strain map for CrCoNi deformed at 20K. The location of the extracted TEM foil is marked with a blue band. g BF-TEM overview image of the corresponding TEM foil. An enlarged view of the region marked using a blue box in (g) is shown in (h). The inset shows the surface step formed due to localized plastic deformation. i SADP revealing the presence of an extended deformation twin. The electron beam was parallel with the [011] crystallographic zone axis.