Fig. 6: Discovery and characterization of other layered structure according to the proposed strategy.

XRD pattern with Rietveld refinement (a) schematic crystal structure (b) electrochemical performance at 30 °C (1 C = 320 mA g⁻¹) (c) and in-situ XRD patterns of K₂VP₂O₈ at 30 °C (initial two cycles at 0.3 C) (d). XRD pattern with Rietveld refinement (e), schematic crystal structure (f) electrochemical performance at 30 °C (1 C = 340 mA g⁻¹) (g) and in-situ XRD patterns of K₂MgV₂O₇ at 30 °C (initial cycle at 0.2 C) (h). i, j XRD pattern with Rietveld refinement (i), and in-situ XRD patterns of Rb₃V₅O₁₄ at 30 °C (initial cycle at 0.2 C,1 C = 342 mA g⁻¹) (j).