Fig. 2: Chemical properties of Ru loaded CeO2 and N doped CeO2.

a Linear correlation between the N dopant concentration and the Ru reduction temperature from H2-TPR. X-Ray absorption spectroscopy on the Ru K-edge of ruthenium NPs supported on nitrogen-doped cerium oxide catalysts. b The plot of k3-weighted Fourier transforms of the Ru K-edge EXAFS spectra. c XANES spectrum. d, e Wavelet transformation plots for the k3-weighted EXAFS signal of Ru/N-CeO2 (650-6) AS (d), intensity maximum at (5.01 Å−1, 1.49 Å) and Ru/CeO2 AS (e), intensity maximum at (6.64 Å−1, 1.57 Å). f Ru 3p XPS spectra of the ruthenium NPs supported on cerium oxide and nitrogen-doped cerium oxide catalysts. g, h High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) of Ru/N-CeO2 (650-6) (g) and Ru/CeO2 (h). i, j HAADF images showing the plain N-CeO2 (650-6) support without Ru impregnation. k, l High resolution HAADF images showing Ru NPs located on the (110) plane of N-CeO2 (650-6) support. m Annular bright-field scanning transmission electron microscopy (ABF-STEM) of Ru NPs supporting on N-CeO2 (650-6), illustrating the distortion at the Ru (011) (green line) and support’s (001) (purple line) surface, the distorted Ru atoms are highlighted with red outer shells.