Fig. 3: THz emission from Purcell-enhanced directional photocurrent in WTe2 self-cavities.
From: Purcell enhancement of directional edge photocurrent in a van der Waals self-cavity
a The time-domain THz emitted field of Device A when photoexcited outside the co-planar stripline, as shown in the micrograph inset. The orange arrow illustrates the direction of the crystalline a-axis. The yellow bar indicates 10 μm. b Fourier transform of the time-domain field from panel (a), with the finite frequency resonance, corresponding to the Purcell enhancement, indicated by a black arrow. c Fluence dependence of the THz emission peak extracted from (b) (top) and resonance frequency (bottom), used in conjunction with the cavity quality factor to calculate the undamped frequency (dashed line). Error bars indicate the uncertainty of the peak position (see Supplementary Note 3). d Time domain traces at varying fluences, e Fourier-transformed spectra showing resonance evolution, and f resonance amplitude and frequency for Device B. Dashed line indicates undamped frequency and error bars indicate the uncertainty of the peak position (see Supplementary Note 3).
