Fig. 1: Characterization of a La2TiFeO6 film on a SrTiO3 (001) substrate. | npj Computational Materials

Fig. 1: Characterization of a La2TiFeO6 film on a SrTiO3 (001) substrate.

From: Study of disorder in pulsed laser deposited double perovskite oxides by first-principle structure prediction

Fig. 1

XRD (a) shows peaks corresponding to single-phase perovskite La2TiFeO6, but peaks indicating B-site ordering of Ti and Fe are absent. XPS (b) shows the presence of Fe2+ in (001) oriented films and is visible as a shoulder around 709 eV. XPS additionally shows Ti is completely 4+ (data not included). c AFM measurements show smooth films with terrace height differences of 0.5 unit cells. Also, TEM (d) reveals a high structural quality of the grown films and the absence of B-site order. e XRD reciprocal space mapping around the (103) reflection reveals that the strained film exhibits tetragonal symmetry with cell parameters a = 3.905 Å and c = 4.01 Å.

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