Fig. 3: SEM characterization of the microstructure for parts with different process parameters.

High magnification images a, b, and c are the side view (normal to the scan direction) of samples from the three cases, while d, e, and f show the top view (normal to the build direction). The locations of probed points are (x, z) = (8.3, 34.6) mm, (15, 32.8) mm and (15.1, 39.3) mm for Case A, B, and C respectively. Some original SEM images (a–c) are reprinted from ref. ⁷⁴ with permission from Elsevier. g Comparison of computed cooling rate, microstructure, and mechanical properties of different thin walls. Values are tabulated in Supplementary Table 5 normalized by the mean across the three cases. The error bars for primary dendrite arm spacing, UTS, yield stress, failure stress, and modulus give standard deviations of repeated experiments. Cooling rate and volume fractions of Laves phases are calculated based on a single simulation and measurement and therefore have no standard deviation reported. The scale bars in (a–f) are 40 μm.