Fig. 5: Experimental strain maps measured from single crystal hexagonal-boronitride thin films. | npj Computational Materials

Fig. 5: Experimental strain maps measured from single crystal hexagonal-boronitride thin films.

From: Disentangling multiple scattering with deep learning: application to strain mapping from electron diffraction patterns

Fig. 5: Experimental strain maps measured from single crystal hexagonal-boronitride thin films.

a Mean diffraction images of 20x20 probe positions, for STEM probes defined by 3.4, 0.86, 3.4, and 12 mrad semiangle apertures, where the leftmost aperture also contains a bullseye pattern. Scale bar is equal to 1 Å−1. b Strain maps measured using cross-correlation template matching for the 4 cases given above. c Strain maps measured using the FCU-Net network predictions. For all maps, the mean and standard deviation strains/angles are inset, relative to the correlation bullseye 3.4 mrads measurement. Scale bar is equal to 200 nm.

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