Fig. 1: The microstructure for an Al film.
From: Point process microstructural model of metallic thin films with implications for coarsening
a A representative microstructure for an Al film that was annealed for 150 min at a temperature T = 400 °C. Grain colors reflect crystallographic orientations. b An automated trace of the grain boundaries and triple junctions corresponding to the microstructure shown in part a.
