Fig. 4: The triple-junction disorientation distribution function for as deposited and annealed films. | npj Computational Materials

Fig. 4: The triple-junction disorientation distribution function for as deposited and annealed films.

From: Point process microstructural model of metallic thin films with implications for coarsening

Fig. 4

a The probability density function, p(ϕ), for triple-junction disorientation, ϕ, for as deposited Al films (histogram). Also shown is the theoretical probability density function for randomly oriented grains in a cubic system (blue line), as determined by MacKenzie23. Note the texturing that is evident for ϕ ≈ 60o, corresponding to a twin. b The same as for part a., except for the annealed film.

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