Fig. 5: The partial and mark correlation function for triple junctions.
From: Point process microstructural model of metallic thin films with implications for coarsening
a The correlation function ratio, \({g}_{\alpha \beta }\left(r\right)/g\left(r\right)\), versus r/d(t) for Al films under the same conditions as listed in Fig. 1a. The disorientations, ϕ, considered here are in the interval [55.0o, 61.0o]. The relative partial pair correlation function for disorientations close to the twin disorientation of 60o do not indicate strong spatial correlations, suggesting that the associated grain boundaries are essentially randomly distributed in the microstructure. The as-deposited (annealed) results are shown in blue (gold). bThe mark correlation function, mαα(r), versus r/d(t) for Al films under the same conditions as listed in Fig. 1a. ϕ is in the interval [50.0o, 60.0o].
