Fig. 2: Evolution of polar states in PTO thin films under an OP electric field E[001].
From: Emergence and transformation of polar skyrmion lattices via flexoelectricity

Field-dependent polarization configuration, structural factor and Pontryagin density near the top plane of the PTO thin films simulated at the condition of a f11 = f12 = f44 = 0 V, b f11 = 3 V and f12 = f44 = 0 V, respectively. Structural factors for these polar states are computed via two-dimensional Fourier Transform of (P3 – <P3>), with <P3> being the average OP polarization of the PTO thin films.