Fig. 5: Performance of DTNet models on dielectric data from Materials Project.

a, b Plot of the mean error/correlation (points) with standard deviation (shadow) for 5 runs against the intermediate embedding generated from the PFP-Ln as DTNet inputs, showing both transfer learning results and training from scratch results for comparison. c–e Multiple MAE metrics in the dielectric tensor for different crystal systems on the prediction of the electronic, ionic and total task.