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Interpretable deep learning for atomicity classification of platinum nanoclusters in STEM images
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  • Published: 27 February 2026

Interpretable deep learning for atomicity classification of platinum nanoclusters in STEM images

  • Keizo Tsukamoto1,
  • Naoyuki Hirata1,
  • Masahide Tona1 &
  • …
  • Atsushi Nakajima2 

npj Computational Materials , Article number:  (2026) Cite this article

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We are providing an unedited version of this manuscript to give early access to its findings. Before final publication, the manuscript will undergo further editing. Please note there may be errors present which affect the content, and all legal disclaimers apply.

Subjects

  • Materials science
  • Mathematics and computing
  • Nanoscience and technology
  • Physics

Abstract

Determining the number of constituent atoms in metallic nanoclusters (NCs) directly from imaging is key to understanding how atomicity governs their size-dependent properties. Scanning transmission electron microscopy (STEM), which captures real-space images of materials with tunable magnification down to the atomic scale, provides an invaluable means to probe such structures. However, despite these advantages, automated and accurate identification of NC atomicity remains challenging, requiring robust extraction of features such as projected shape and contrast distribution from imaging data. To address this challenge, we present a deep learning framework that classifies platinum NCs (Ptn; n = 19, 30, 41, 55, 70) using high-resolution aberration-corrected STEM images. A convolutional neural network extracts structural features that are separable in UMAP (Uniform Manifold Approximation and Projection) space, with class-specific focus visualized using Grad-CAM (Gradient-weighted Class Activation Mapping). The model achieves high accuracy, even for mixed-atomicity samples (n = 19, 41, 70) on a shared substrate. To address domain shift, we apply fine-tuning with high-confidence pseudo-labels, significantly recovering performance. A dual-channel model integrating Local Contrast Normalization (LCN) filtering achieves a coefficient of determination of R² = 0.94 ± 0.03, outperforming size-based classification. This framework automates atomic-scale classification from STEM images and advances autonomous workflows via real-time analysis and machine learning based decisions.

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Data availability

The datasets generated and analyzed during the current study, including STEM image patches and class labels, are available at Zenodo under the https://doi.org/10.5281/zenodo.18014239. All relevant documentation, including data format specifications and Python environment files, is provided to ensure full reproducibility of the results.

Code availability

The code used for training, inference, and visualization in this study is available at Zenodo under the https://doi.org/10.5281/zenodo.18014239. The repository includes scripts for data preprocessing, model training, evaluation, Grad-CAM visualization, and UMAP projection, along with documentation and environment configuration files to ensure reproducibility.

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Acknowledgements

This work was partly supported by the Aichi Prefectural Government under the “Knowledge Hub Aichi”, Priority Research Project (4th term), by the Advanced Research Infrastructure for Materials and Nanotechnology in Japan (ARIM) (Project Issue Number: 24NM0110), and by JSPS KAKENHI Grant-in-Aid for Scientific Research (B) (No. 24K01442). The authors are grateful to Prof. Y. Adachi (Nagoya University) and Prof. M. Hatanaka (Keio University / IMS) for valuable discussion on machine learning procedures.

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Authors and Affiliations

  1. Ayabo Corporation, Anjo, Aichi, Japan

    Keizo Tsukamoto, Naoyuki Hirata & Masahide Tona

  2. Department of Chemistry, Faculty of Science and Technology, Keio University, Yokohama, Kanagawa, Japan

    Atsushi Nakajima

Authors
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Contributions

Conceptualization: K.T., N.H., M.T., A.N. Methodology: K.T., N.H., M.T., A.N. Investigation: K.T., N.H., M.T., A.N. Visualization: K.T., N.H., M.T., A.N. Supervision: K.T., A.N. Writing—original draft: K.T., N.H., M.T., A.N. Writing—review & editing: K.T., N.H., M.T., A.N.

Corresponding authors

Correspondence to Keizo Tsukamoto, Masahide Tona or Atsushi Nakajima.

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The authors declare no Competing Non-Financial Interests but the following Competing Financial Interests: They all are inventors on JAPAN patent JP 2025-142865, submitted by Ayabo Corporation and Keio University, which cover the application related to the classification system using electron microscopy images of NCs described in this manuscript.

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Tsukamoto, K., Hirata, N., Tona, M. et al. Interpretable deep learning for atomicity classification of platinum nanoclusters in STEM images. npj Comput Mater (2026). https://doi.org/10.1038/s41524-026-02014-z

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  • Received: 30 September 2025

  • Accepted: 09 February 2026

  • Published: 27 February 2026

  • DOI: https://doi.org/10.1038/s41524-026-02014-z

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Machine learning for automated experimentation in scanning transmission electron microscopy (STEM)

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