Fig. 6: Critical strain for shear-band formation with different removal fractions. | npj Computational Materials

Fig. 6: Critical strain for shear-band formation with different removal fractions.

From: Computational study of density fluctuation-facilitated shear band formation in bulk metallic glasses

Fig. 6: Critical strain for shear-band formation with different removal fractions.The alternative text for this image may have been generated using AI.

The critical shear-banding strain for BMG with 0.5% to 3% atoms removed within 3 Å from the \((\overline{1}01)\) plane are shown. When the removal fraction is below 1.5%, the critical strain decreases rapidly with additional atom removal. When removal fraction exceeds 1.5%, the critical strain saturates and remains within the typical shear-band nucleation range of 7−10%.

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