Fig. 7: Scanning Transmission Electron Microscopy-Electron Energy Loss Spectroscopy (STEM-EELS) compositional analysis of Ni, Co, Fe, and Cr elements from the irradiated and pristine regions. | npj Materials Degradation

Fig. 7: Scanning Transmission Electron Microscopy-Electron Energy Loss Spectroscopy (STEM-EELS) compositional analysis of Ni, Co, Fe, and Cr elements from the irradiated and pristine regions.

From: Nanostructured NiCoFeCr alloy with superior high-temperature irradiation resistance

Fig. 7

The STEM-EELS compositional maps illustrate the distribution of the elements a Ni, b Co, c Fe, and d Cr from the irradiated region. e, f The plots describe the compositional variation at two of the grain boundaries, along the blue and yellow dotted lines, respectively, shown in (a). The STEM-EELS compositional maps also illustrate the distribution of the elements g Ni, h Co, i Fe, and j Cr from the pristine region.

Back to article page