Fig. 2: Structural analysis and PFM measurement.
From: Control of ferroelectric polarization in BiFeO3 bilayer films through interface engineering
a XRD θ–2θ scans of both samples A (solid red line) and B (solid blue line). RSM images around the (103) STO Bragg peaks for the samples A (b) and B (c). d, e Rocking curves around the (002) diffraction peaks of the BFO1 (top panel) and BFO2 (bottom panel) for sample A (d) and BFO for sample B (e). Out-of-plane PFM phase (top panels) and amplitude (bottom panels) versus voltage hysteresis loops for samples A (f) and B (g).
