Abstract
Conventional solid electrolyte interphases (SEIs) strongly adhere to micro-silicon (µ-Si) and crack under volume changes, causing poor cycling performance. Nano-silicon improves cycling performance but remains costly with limited calendar life. Here potentiostatic ageing tests demonstrate that both calendar and cycle ageing are governed by SEI cracking and dissolution with different relative contributions. When the system is not dominated by SEI dissolution, the relative calendar life of Si anodes could correlates positively with their cycle life. LiF-rich SEI that enables long cycle life in µ-Si is therefore expected to enhance calendar life as well. Using this framework, we screened electrolytes, SEIs and electrodes and validated them with full-cell storage. LiF-rich SEI minimizes cracking and dissolution, enabling μ-Si to achieve excellent calendar life, whereas nano-silicon suffers from SEI dissolution and needs reduced electrolyte–electrode contact for better calendar life. This work clarifies calendar-ageing behaviour and accelerates electrolytes and SEI development for long-life Si anodes.
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Data availability
The authors declare that all data supporting the findings of this study are available within the paper and Supplementary Information files. Source data are provided with this paper.
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Acknowledgements
This research was supported by US Department of Energy, Vehicle Technologies Office (DOE-VTO) under the Silicon Consortium Project, directed by N. Eidson, C. Steinway, T. Do and B. Cunningham, and managed by A. Burrell. The was supported by DOE Office of Energy Efficiency and Renewable Energy (EERE) grant DE-EE0009183 (W.Z. and C.W.) We acknowledge the technical support from the Maryland NanoCenter.
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W.Z. conceived the idea, performed experiments and wrote the manuscript. N.Z. performed EQCM measurements and assisted with electrochemical tests. Z.W. performed calculations. A.-M.L. provided ionic liquids and assisted with related full-cell ageing. S.L., Y.L. and Z.L. helped with the testing. T.L., Y.C. and L.Z. helped on electrode engineering. H.W., S.-C.L. and J. Rao helped on transmission electron microscopy. J. Roschella edited and improved the manuscript. Z.Z. and H.H. conduced the AFM at Rutgers University. B.L.L. helped with the XPS test. C.S.J. guided the analysis and manuscript writing. C.W. supervised the study and the manuscript writing. All authors discussed the results.
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Zhang, W., Zhang, N., Wang, Z. et al. Mechanistic understanding of interphase-driven ageing in silicon anodes. Nat Energy (2026). https://doi.org/10.1038/s41560-026-01967-1
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DOI: https://doi.org/10.1038/s41560-026-01967-1