Extended Data Fig. 6: Scanning transmission electron microscopy characterizations of a superconducting La3Ni2O7 film.
a, High-angle annular dark-field (HAADF) image with a large field-of-view of a 3-u.c.-thick La3Ni2O7 film grown on a SrLaAlO4 substrate. Dash lines represent the interface between the film and the SrLaAlO4 substrate. b, HAADF image and atomic-resolution energy-dispersive X-ray spectroscopy (EDS) elemental maps (La, Ni, Al, Sr) of the same region. The yellow curves represent the profiles of atomic row-integrated elements intensity. The area between the dashed lines indicates the surface reconstruction region of the SrLaAlO4 substrate.
