Extended Data Fig. 2: Optical image of the measured sample.
From: Large moiré superstructure of stacked incommensurate charge density waves
Optical micrograph of the EuTe4 flake measured in the X-ray diffraction experiment. The long and straight edge of the flake is parallel to the a-axis of the crystal. A clear and straight edge usually indicates good crystallinity for EuTe4. Successful exfoliation of single-domain EuTe4 flakes is pivotal to the success of the experiment. We note that amorphous glass cover slides are chosen as the substrates in order to avoid extra diffraction peaks in the reciprocal space mapping experiment. The scales bar corresponds to 100 μm.
