Extended Data Fig. 8: Effects of thermal vibration and noise on iDPC-STEM images.
From: Atomic imaging of zeolite-confined single molecules by electron microscopy
a, Effect of thermal vibration on iDPC-STEM images studied by image simulations. The sigma of TDS ranges from 0.1 to 0.5. b, Effect of Poisson noise on iDPC-STEM images studied by image simulations. The electron doses in the simulations are 1,500 and 3,000 e− Å−2, respectively. The thickness is 4 nm (2-unit-cell thickness). c, Simulated image with no TDS and noise with a profile direction (white arrow) for the profile analysis in d and e. d,e, Profile analysis to show the effects of thermal vibration and noise on iDPC-STEM images.
