Extended Data Fig. 1: Thin (quasi-2D) areas in ZSM-5 crystal.
From: Atomic imaging of zeolite-confined single molecules by electron microscopy
a, Annular dark-field STEM image showing the lateral view of the thin area in ZSM-5 crystal. The thickness of the thin area is about 4 nm, which can be measured from this lateral view. b,c, Thickness mapping and profile analysis by EELS. The measured thickness of this thin area is also about 4 nm. d, PACBED pattern at the thin area of ZSM-5 crystal. The simulated pattern for a sample thickness of 6 nm is given to compare with the experimental result. e, Profile analysis of the experimental and simulated PACBED patterns to estimate the thickness of this thin area. The position of profiles is given in d. The inset shows the least-squares fitting of the experimental PACBED pattern with the simulated ones, indicating that this area is about 6 nm thick.
