Extended Data Fig. 7: In-plane XRD measurements.
From: Realization of 2D metals at the ångström thickness limit
a, XRD pattern of φ scan using Al2O3 (110), MoS2 (110), and Bi (100) Bragg condition respectively. b,c, XRD pattern of an in-plane scan around the Bi (100) Bragg condition (b) and around the Bi (010) Bragg condition (c). The 2θ angle of 35.104° ± 0.045° (37.764 ± 0.013°) indicates the lattice parameter of monolayer Bi 5.108 ± 0.006 Å (4.760 ± 0.001 Å), which matches well with the measured TEM results.
