Extended Data Fig. 7: Characterization of PMN-PT on STO with various thicknesses. | Nature

Extended Data Fig. 7: Characterization of PMN-PT on STO with various thicknesses.

From: Atomic lift-off of epitaxial membranes for cooling-free infrared detection

Extended Data Fig. 7

a, 2 theta-omega XRD scans, and b, rocking curve of PMN-PT (002). XRD spectrums are shown for PMN-PT layers grown on STO substrate with thicknesses ranging between 10 to 200 nm. The vertical dashed line indicates the peak position for bulk PMN-PT. Good crystallinity is confirmed by the FWHM of the rocking curve ranging from 0.07° to 0.53°.

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