Extended Data Fig. 1: Impact of background noise on the reconstruction of a 208 atoms amorphous silicon nanoparticle.
From: Limit of atomic-resolution-tomography reconstruction of amorphous nanoparticles
Two examples of (a) without and (b) with the background are shown using simulated and reconstructed projection images and the reconstructed tomograms (in the form of iso-surfaces). The amount of background noise is equivalent to the Poisson noise of 1 electron. The incident fluence is 1.6 × 104 e/Å2.
