Extended Data Fig. 5: Impact of depth section and random defocus on the reconstructed tomograms of an 8 nm amorphous Si nanoparticle.

(a) Depth sectioning, the projection image here is a sum of ten simulated images with 1 nm increment in focus at each rotation. (b) Random focus, a random focus is selected between 0 to 10 nm for the projection image at each rotation. An example of the simulated projection image after preprocessing is shown together with the reconstruction image and a 1 nm slice of the computed tomogram using the SIRT algorithm. The tomograms show the recovery of nearly uniform and isotropic peaks.