Correction to: Scientific Reports https://doi.org/10.1038/s41598-022-18138-3, published online 30 September 2022


The original version of this Article contained an error in Figure 2, where the y-axis label “Range mm” in panel (A) was incorrectly described as “Range nm”, and the y-axis units in panel (B) “2.5”, “2.0”, “1.5”, “1.0”, “0.5” and “0.0” were incorrectly described as “25”, “20”, “15”, “10”, “5” and “0”, respectively. The original Figure 2 and accompanying legend appear below.

Figure 2
figure 2

Electron ranges in SMFs calculated by etsmode and EGS. (A) shows the penetration length and projected range in the absence of a SMF (B = 0.0 T) and (B) shows the projected range in the presence of various SMF strengths (B = 0.0–10.0 T). The simulation results by etsmode and EGS are in good agreement with each other and other simulation results by the Geant4-DNA toolkit30. As shown in Fig. 2B, the projected range of high-energy electrons is largely affected by the SMF strength.


The original Article has been corrected.