Table 5 Internal fault scenarios for testing data.
Transient period [1ms] | Collected samples | Fault resistance (Ω) | Fault distance (km) | Noise (db) |
|---|---|---|---|---|
1st segment | 160 | 10,35,60,…,160,185 | 5,15,25,…,175,185,195 | 20,25, 30 |
2nd segment | 240 | 10,35,60,…,260,285, | 5,15,25,…,175,185,195 | 20,25, 30 |
3rd segment | 320 | 10,35,60,…,460,485 | 5,15,25,…,175,185,195 | 20,25, 30 |