Fig. 5
From: Nanoscale 3D spatial analysis of FTO/ZnO/Ag-x films subjected to photocatalytic activity
Plots of XRD data taken from the reference substrate (bare FTO) and samples containing various amounts of Ag dopants in ZnO crystals: (A) XRD spectra indexed with appropriate (hkl) indices of crystalline components, (B) Williamson-Hall graph exhibiting relative strains and finite crystalline sizes within FTO/ZnO/Ag-0 film.
