Table 3 Crystallographic parameters of the samples, based on the main diffraction orientation (104) and Raman FWHM for 416 cm−1 peak.
From: Effect of substrate temperature on properties of WS2 thin films
Sample | 2θ(104) (°) | FWHM XRD (°) | D(nm) | \(\:{\updelta\:}(\times\:{10}^{-3}{\text{n}\text{m}}^{-2})\) | \(\:{\upepsilon\:}(\times\:{10}^{-3})\) | FWHM Raman (cm−1) |
|---|---|---|---|---|---|---|
T25 | 37.60 | 0.96 | 9.13 | 12.02 | 3.97 | 13.82 |
T100 | 37.52 | 0.96 | 9.14 | 12.00 | 3.96 | 13.04 |
T200 | 37.35 | 0.60 | 14.62 | 4.68 | 2.48 | 11.85 |
T300 | 37.60 | 0.72 | 12.19 | 6.72 | 2.97 | 22.87 |
