Table 1 Evaluating improvement of IoU, precision, and recall using DualSight on held-out test set of 20 SEM micrographs of powder particles.

From: DualSight: multi-stage instance segmentation framework for improved precision

 

IoU

Precision

Recall

Mean

Min

Max

Mean

Min

Max

Mean

Min

Max

YOLOv8 Nano

0.757

0.581

0.853

0.921

0.828

0.961

0.799

0.603

0.920

SAM

0.548

0.192

0.784

0.877

0.760

0.947

0.591

0.201

0.830

DualSight

0.816

0.592

0.930

0.926

0.836

0.976

0.859

0.649

0.956