Fig. 2
micro-Raman mapping and spectroscopy of Te inclusion embedded within bulk CZT crystal. (a) Optical microscopy image with correlated (b) line-trace of the Raman response over an individual Te inclusion showing the intensity variation and spectral shifts of the Raman response. The location of the line trace is marked by green dashed line in panel (a). A comparison of the Raman spectra measured at (c) a Te inclusion (position marked by the red circle in (a) and (d)) and the bulk CZT (position marked by black circle in (a)). Integrating the Raman response over a spectral range spanning from 110 to 150 cm−1, the intensity variation of the Raman response increases by a factor of ~ 6 × at the Te inclusion with respect to the bulk CZT.
