Fig. 3
IR s-SNOM mappings of Te inclusions embedded within bulk CZT crystals. (a, b) Topography and associated s-SNOM scattering amplitude images recorded over a large hexagonal Te inclusion embedded in a bulk CZT crystal. Panels (c, d) and (e–g) demonstrate imaging of the spatial correlation of the presence of Te inclusions with grain boundaries (blue-dashed line). (c, d) shows topography and s-SNOM amplitude of a Te inclusion located at a sub-grain boundary. Panels (e–g) show topography, s-SNOM amplitude, and s-SNOM phase of a series of Te inclusions located along a sub-grain boundary (blue dashed line) in a bulk CZT crystal. All IR s-SNOM data were recorded using lock-in filtering at the 3rd harmonic of the AFM dither frequency (\(3{\Omega }_{d}\)).
