Fig. 4 | Scientific Reports

Fig. 4

From: Multimodal characterization of Te inclusions in Cd1−xZnxTe and Cd1−xZnxTe1−ySey for gamma and X-ray detectors

Fig. 4

KPFM mapping image of a hexagonal Te inclusion within a bulk CZTS crystal. (a, b) Topography and KPFM potential images, respectively. (c) Line trace showing the spatial variation of the CPD as the location denoted by the dashed white line in panels (a, b). The dashed blue line displays an exponential fit of band bending in the bulk crystal in proximity to the inclusion. (d) Illustration of the band bending induced carrier funneling to Te-inclusion trap sites.

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