Fig. 5
(a) Topography and corresponding (b) KPFM imaging of surface potential changes of Te inclusion defects located along a sub-grain boundary located in a bulk CZT crystal. Zoom in (c) topography and (d) KPFM scans of the area marked by the white box in (a, b), illustrating the surface potential change, which occurs at the sub-grain boundary (blue dashed line). (e) Line-trace of the variation of the surface height and measured KPFM contact potential difference along the white line shown in (c, d). Moving from the grain on the left to the grain on the right, the surface topography varies by only a few nanometers while the surface potential increases by ~ 85 mV.
