Fig. 3
Characterization analysis of CuS NPs by XRD diffractogram, Fourier transform infrared spectroscopy (FTIR) spectrum, and scanning electron microscopy (SEM) image.
Fig. 3 | Scientific Reports
Characterization analysis of CuS NPs by XRD diffractogram, Fourier transform infrared spectroscopy (FTIR) spectrum, and scanning electron microscopy (SEM) image.
