Table 1 Values of the defect density in the QW used for the simulations.

From: Diffusion mechanism as cause of optical degradation in AlGaN-based UV-C leds investigated by TCAD simulations

Stress time (min)

1000

2000

5000

10,000

20,000

\(\:{N}_{T,QW}\:\left({cm}^{-3}\right)\)

\(\:5\:\times\:\:{10}^{15}\)

\(\:8.33\:\times\:\:{10}^{15}\)

\(\:1.42\:\times\:\:{10}^{16}\)

\(\:1.95\:\times\:\:{10}^{16}\)

\(\:2.45\:\times\:\:{10}^{16}\)

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