Fig. 5
From: Development of a VSS-EWMA chart for coefficient of variation with application to production process

DACV control chart for semiconductor dataset for \({n_1}=5,{n_2}=10\,and\,\lambda =0.15\).
From: Development of a VSS-EWMA chart for coefficient of variation with application to production process

DACV control chart for semiconductor dataset for \({n_1}=5,{n_2}=10\,and\,\lambda =0.15\).