Fig. 5

The CV plots of the Co-MOF/NiS-Ni3S4//AC ASC (a) at various potentials, (b) at different scan rates; (c) The GCD plots of the ASC device at different current densities with a potential window of 0–1.3 V; (d) The EIS fitting model and equivalent circuit for the Co-MOF/NiS-Ni3S4//AC ASC; (e) Cyclic stability after 1000 cycles; (f) Ragone plot comparing our results with other relevant works.