Fig. 2 | Scientific Reports

Fig. 2

From: A stochastic dual-phase-lag two-temperature photo-thermoelastic model for double-porosity semiconductors with initial stress

Fig. 2

Stochastic sample paths of temperature, carrier density, and stress at t=0.4, illustrating random fluctuations due to boundary noise. Gray thin lines denote individual stochastic realizations, while the red solid curve indicates the deterministic mean profile. The results demonstrate how stochastic perturbations cluster around the deterministic solution.

Back to article page