Fig. 4 | Scientific Reports

Fig. 4

From: Tracking oxygen vacancy migration in memristor devices using operando hard X-ray photoelectron spectroscopy

Fig. 4

Al 1s core line at 3500 eV photon energy for different applied bias. The metal line indicated in the spectrum is from the Al bottom electrode. The red line is the OFF state and the blue line the ON state. The sample was preconditioned by I–V cycling to achieve reproducible SET/RESET behavior prior to HAXPES measurements; it was not in the pristine, pre-forming state.

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