Fig. 3

Cross-sectional TEM-based analyses of the Ge_1−xSn_x (a–c) and Si_1−x−yGe_ySn_x (d–f) JNTs for the center of the Pt/Au top gate (a, b, d, e), and at the Ni source/drain contact (c and f). The EDXS-based element distribution analyses in (b and c) show superimposed maps for Si (green), Ge (blue), Pt (magenta), Au (light blue), Al (orange), and Ni (cyan).