Fig. 4 | Scientific Reports

Fig. 4

From: Enhancing maize seed resistance to chilling stress through seed germination and surface morphological changes using high voltage electrostatic field

Fig. 4

Seedling growth map of low-temperature group (a) and normal-temperature group (b) of maize seeds cultivated for 168 h treated by typical strength electric field. Only the typical seedling growth maps of 1.6 kV/cm, 2.0 kV/cm, and control groups were shown in the diagram, and the growth of seedlings gradually deteriorated from left to right.

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