Fig. 6
From: Impact of electron cyclotron wave resonance plasma on defect reduction in ZnO thin films
(a) Schematic diagram of the aluminum electrodes deposited on the ZnO film to measure the photoconductivity of the films when irradiated by a VUV lamp emitting from about 115 nm to 1700 nm. (b) I-V characteristics of the ZnO films for applied bias voltages ranging from 0 V to 5 V. (c) Photosensitivity of the ZnO films for an applied bias voltage of 5 V.
