Fig. 7
From: Impact of electron cyclotron wave resonance plasma on defect reduction in ZnO thin films
Transient photoconductivity of ZnO thin films in (a) cm2/Vs and (b) normalized to 1. Inset in (a) shows the peak conductivity at each PECWR. Dash traces in (b) are exponential fitting of the transient decay. Measured using λexc = 360 nm and Iexc = 0.2 × 1012 ph/cm2.
