Table 2 Crystallite size (in nm) for each of the peaks indexed in the XRD spectra.

From: Impact of electron cyclotron wave resonance plasma on defect reduction in ZnO thin films

PECWR (W)

(100)

(002)

(101)

(102)

(110)

(103)

(112)

0

40.8

45.6

36.7

28.6

29.7

27.0

22.3

100

40.8

47.0

30.0

34.7

27.4

28.3

22.3

200

45.7

47.0

26.9

38.1

29.7

28.3

27.0

300

31.0

32.3

20.7

27.1

19.8

19.4

16.9

380

27.2

32.3

23.5

26.6

20.4

18.4

19.1