Fig. 4
Energy band diagram for RRAM (a) before contact and (b) after contact. Enlarged Band Diagram of the SiOx/Si Interface and corresponding equivalent circuit under various conditions. Accumulation is shown in (c) at room temperature and (f) at high temperature, depletion in (d) at room temperature and (g) at high temperature, and inversion in (e) at room temperature and (h) at high temperature.
