Table 1 Parameters definition
From: Cryo-CLXEM introduces cryo-SXT to bridge the resolution gap in cryo-CLEM
X-ray microscopy | Definition/units | Electron Microscopy (EM) | Definition/units |
|---|---|---|---|
Radiation dose | \(D[{{{\rm{M}}}{{\rm{G}}}}_{{{\rm{y}}}}]\) = Amount of energy deposited on the sample per unit mass | Radiation Dose | D = Incident electron charge per unit area |
Energy of the source | E(eV) | Energy of the source | E(keV) |
Flux | n° ph/s | Flux | n° electrons/s |
Flat field | f [counts/s] | Camera gain reference | counts |
Flux/unit area | N\(\left[\frac{{ph}}{\mu {m}^{2}s}\right]\,\) | Flux/unit area (Dose rate) | \({{\rm{N}}} = \left[\frac{{e}^{-}}{{{px}}^{2}\,s}\right]\) |
Fluence = flux/unit area \({{\cdot }}{{\bf{t}}}\) = N \(\cdot\) t | \(\,{F}\left[\frac{ph}{\mu {m}^{2}}\right]\,\) | Fluence (Exposure Dose) = flux/unit area \({{\cdot }}{{\bf{t}}}\) = N \(\cdot\) t | \(F\) = \(\left[\frac{{e}^{-}}{{{{\text{\AA }}}}^{2}}\right]\) |
