Fig. 6: Morphological analyses of Glc1-b-Toc, Glc2-b-Toc, and Glc1-b-Far.

a SAXS profiles for the bulk samples thermally annealed at 80 °C for 6 h revealed d = 4–6 nm microphase separation. b AFM height image, and c corresponding cross-sectional profiles of the as-cast Glc1-b-Far thin film confirmed the horizontally orientated LAM formation in ~4-nm-thick layers.